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Technical Session ITT-5 |
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Title: |
Automotive Applications / Industrial Signal Processing (Poster) |
Time: |
Wednesday, March 17, 3:45 PM - 5:45 PM |
Location: |
Exhibit Hall E 3 |
Chair: |
Mike Deisher (Intel) |
3:45 PM |
ITT-5.1
Application of a Brightness-Adapted Edge Detector for Real-Time Railroad Tie Detection in Video Images
Joerg Velten,
Anton Kummert (Laboratory for Communication Theory, Department of Electrical Engineering, University of Wuppertal FB13, 42097 Wuppertal, Germany),
Dirk Maiwald (STN ATLAS Elektronik GmbH)
[abstract] [manuscript]
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ITT-5.2
Improved Knock Detection by Time Variant Filtered Structure-Borne Sound
Sönke Carstens-Behrens,
Michael Wagner,
Johann F Böhme (Ruhr University Bochum, Department of Electrical Engineering, D-44780 Bochum, Germany)
[abstract] [manuscript]
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ITT-5.3
Speech-Enabled Information Retrieval in the Automobile Environment
Yeshwant K Muthusamy,
Rajeev Agarwal,
Yifan Gong,
Vishu R Viswanathan (DSP Solutions R&D Center, Texas Instruments)
[abstract] [manuscript]
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ITT-5.4
A DSP Active Filter For Power Conditioning
Abdurrahman Unsal,
Annette R von Jouanne,
Virginia L Stonick (ECE Dept, Oregon State University)
[abstract] [manuscript]
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ITT-5.5
Fourier and Wavelet Transform Features for Whirl Tower Diagnostics
Scott Fornero,
N. Kehtarnavaz (Texas A&M University, Department of Electrical Engineering),
M. Swaminadham (Texas A&M University, Department of Engineering Technology and Industrial Distribution),
Don A Phillips (Texas A&M University, Department of Industrial Engineering)
[abstract] [manuscript]
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ITT-5.6
An Industrial Application of Signal Processing: Ceramic Microcrack Detection
Ramón Miralles,
Juan Morales,
Luis Vergara (Dpto. Comunicaciones. Universidad Politecnica de Valencia)
[abstract] [manuscript]
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ITT-5.7
Application of Ground Penetrating Radar for Coal Depth Measurement
Jonathon C Ralston,
David W Hainsworth (CSIRO, Exploration and Mining)
[abstract] [manuscript]
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ITT-5.8
CONTROL-ORIENTED IDENTIFICATION AND UNCERTAINTY ESTIMATION FOR PAPER MACHINES
Alf Green (Honeywell-Measurex),
Kostas Tsakalis (Arizona State University),
Ward MacArthur (Honeywell-Hi-Spec Solutions),
Sachi Dash (Honeywell Technology Center-Phoenix)
[abstract] [manuscript]
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